IEC 60749-9-2002 半导体器件.机械和气候试验方法.第9部分:标记的永久性
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【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part9:Permanenceofmarking
【原文标准名称】:半导体器件.机械和气候试验方法.第9部分:标记的永久性
【标准号】:IEC60749-9-2002
【标准状态】:现行
【国别】:国际
【发布日期】:2002-04
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:作标记;组件;定义;定义;环境试验;试验;永久性;气候试验;半导体器件;电子设备及元件;半导体;气候;电气工程;电学测量;机械试验;集成电路;电子工程
【英文主题词】:Climate;Climatictests;Components;Definitions;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Legibility;Marking;Mechanicaltesting;Permanence;Semiconductordevices;Semiconductors;Testing
【摘要】:ThepurposeofthispartofIEC60749istotestandverifythatthemarkingsonsemiconductordeviceswillnotbecomeillegiblewhensubjecttosolventsorcleaningsolutionscommonlyusedduringtheremovalofsolderfluxresiduefromtheprintedcircuitboardassemblyprocess.Thistestisapplicableforallpackagetypes.Itissuitableforuseinqualificationand/orprocessmonitortesting.Thetestshouldbeconsiderednon-destructive.Electricalormechanicalrejectsmaybeusedforthepurposeofthistest.Ingeneral,thistestofpermanenceofmarkingisinconformitywithIEC60068-2-45but,duetospecificrequirementsofsemiconductors,theclausesofthisstandardapply.NOTE1Thisproceduredoesnotapplytolaserbrandedpackages.Manyavailablesolventsthatcouldbeusedareeithernotsufficientlyactive,toostringent,orevendangeroustohumanswhenindirectcontactorwhenfumesareinhaled.NOTE2Thecompositionofsolventsusedinthisstandard,isconsideredtypicalandrepresentativeofthedesiredstringencyasfarastheusualcoatingsandmarkingsareconcerned.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:9P.;A4
【正文语种】:英语
【原文标准名称】:半导体器件.机械和气候试验方法.第9部分:标记的永久性
【标准号】:IEC60749-9-2002
【标准状态】:现行
【国别】:国际
【发布日期】:2002-04
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:作标记;组件;定义;定义;环境试验;试验;永久性;气候试验;半导体器件;电子设备及元件;半导体;气候;电气工程;电学测量;机械试验;集成电路;电子工程
【英文主题词】:Climate;Climatictests;Components;Definitions;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Environmentaltesting;Integratedcircuits;Legibility;Marking;Mechanicaltesting;Permanence;Semiconductordevices;Semiconductors;Testing
【摘要】:ThepurposeofthispartofIEC60749istotestandverifythatthemarkingsonsemiconductordeviceswillnotbecomeillegiblewhensubjecttosolventsorcleaningsolutionscommonlyusedduringtheremovalofsolderfluxresiduefromtheprintedcircuitboardassemblyprocess.Thistestisapplicableforallpackagetypes.Itissuitableforuseinqualificationand/orprocessmonitortesting.Thetestshouldbeconsiderednon-destructive.Electricalormechanicalrejectsmaybeusedforthepurposeofthistest.Ingeneral,thistestofpermanenceofmarkingisinconformitywithIEC60068-2-45but,duetospecificrequirementsofsemiconductors,theclausesofthisstandardapply.NOTE1Thisproceduredoesnotapplytolaserbrandedpackages.Manyavailablesolventsthatcouldbeusedareeithernotsufficientlyactive,toostringent,orevendangeroustohumanswhenindirectcontactorwhenfumesareinhaled.NOTE2Thecompositionofsolventsusedinthisstandard,isconsideredtypicalandrepresentativeofthedesiredstringencyasfarastheusualcoatingsandmarkingsareconcerned.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:9P.;A4
【正文语种】:英语
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